Synchrotron radiation X-ray microdiffraction study of Pb-free solders


N. Tamura

Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720 USA






The technique of Scanning X-ray microdiffraction (mSXRD) arose from the availability of high brilliance synchrotron sources, combined with progress in achromatic X-ray focusing optics and large area 2D-detector technology. The capabilities include grain orientation imaging and stress mapping with submicron spatial resolution, during in-situ conditions. The technique will be described and applications to the study of Sn whisker growth on Pb-free solder finish will be presented. Preliminary results and future applications on Pb-free solder joints will be discussed.