UCLA Henry Samueli School of Engineering and Applied Science
 

 
       
 

 
  Group Photo
  Lab Members
  Recent Publications
  Recent Presentations
  Interesting Results
   
  Dr. Goorsky's Home Page
  UCLA Material Science and Engineering Home Page
  XRD Equipment

 

Interesting Results
with links to PDF images

Lang transmission topographs of misfit dislocation distribution across 150mm diameter p/p+ silicon wafer

Contrast of misfit dislocations with opposite tilt components of their Burgers vectors in double crystal x-ray topography

Silicon self-implantation into strained p/p+ Si inhibits misfit dislocation nucleation and motion during anneal

Misfit dislocation nucleation and glide in low-dose silicon self-implant strained p/p+ Si

Characterization of crystalline perfection in large diameter GaAs and InP substrates using x-ray topography and triple axis x-ray diffraction

High resolution x-ray diffraction studies of strained layers in GaInP/AlGaAs/GaAs cascade solar cells:  Reciprocal Space Maps

Application of x-ray reflectivity to thermoelectric materials: GaAs/AlAs Reflectivity Reciprocal Space Maps

X-ray reflectivity scan of a multilayer gold polymer thin film on a Si substrate

Surface roughening (cross-hatched pattern) caused by increasing concentration of 60o as well as 90o misfit dislocations


 
     
last updated:  6/01